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Theses/Dissertations
Author Tang, Cheng-Fuh Jeffrey.

Title Degradations of MOSFETs from high temperature, radiation and hot electron effects / by Cheng-Fuh Jeffrey Tang.

Published 1987.
LOCATION CALL # STATUS
 MST DEPOSITORY  THESIS T 5494/5508,5529/5539  MICROFILM    NOT CHECKED OUT
 MST Thesis  THESIS T 5497    NOT CHECKED OUT
Description vii, 81 pages : illustrations.
Notes M.S. University of Missouri--Rolla 1987.
Other Titles MST thesis. Electrical Engineering (M.S., 1987).
OCLC/WorldCat Number 16782201
Author Tang, Cheng-Fuh Jeffrey.
Title Degradations of MOSFETs from high temperature, radiation and hot electron effects / by Cheng-Fuh Jeffrey Tang.
Other Titles MST thesis. Electrical Engineering (M.S., 1987).
Permanent Link
http://merlin.lib.umsystem.edu:80/record=b1958033~S5