| Description |
xviii, 268 pages : illustrations ; 28 cm. |
| Summary |
"This study investigates the use of combining an embedded modulated scattering technique, utilizing a PIN diode-loaded dipole (i.e., MST) probe, with traditional near-field microwave nondestructive testing techniques, utilizing open-ended rectangular waveguide probes, for determination of the dielectric properties of a material."--Abstract, p. ii. |
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