Theses/Dissertations
Author Dharavat, Hiten Pravinchandra, 1980-

Title Radiation resistance testing of COTS CMOS chips against continuous gamma radiations / by Hiten Pravinchandra Dharavat.

Published ©2004.
LOCATION CALL # STATUS
 MST DEPOSITORY  THESIS T 8494/8520  MICROFILM    NOT CHECKED OUT
 MST Thesis  THESIS T 8516    NOT CHECKED OUT
Description ix, 142 leaves : illustrations ; 28 cm.
Summary "Electronic components are used in natural radiation environment as well as in the ionizing radiation environment for research purposes. There are components available that are specifically manufactured for use in military and space applications to sustain high level of radiation. These components which are considered to be reliable for use in radiation environment are called "rad-hard components". In contrast to this there are commercial-off-the-shelf (COTS) components, which are readily and cheaply available but no specific effort is made to assure or even test the radiation resistance...This research thus proposes a risk management approach that can be followed in order to use COTS components in radiation environment."--Abstract, p. iii.
Notes Vita.
Includes bibliographical references (pages 139-141).
M.S. University of Missouri--Rolla 2004.
Subjects Metal oxide semiconductors, Complementary -- Testing.
Metal oxide semiconductors, Complementary -- Effect of radiation on.
Other Titles MST thesis. Computer Engineering (M.S., 2004).
Additional Keywords Commercial-off-the-shelf components (COTS)
OCLC/WorldCat Number 56590052
Author Dharavat, Hiten Pravinchandra, 1980-
Title Radiation resistance testing of COTS CMOS chips against continuous gamma radiations / by Hiten Pravinchandra Dharavat.
Subjects Metal oxide semiconductors, Complementary -- Testing.
Metal oxide semiconductors, Complementary -- Effect of radiation on.
Additional Keywords Commercial-off-the-shelf components (COTS)
Other Titles MST thesis. Computer Engineering (M.S., 2004).