| Description |
vii, 73 leaves : illustrations ; 28 cm. |
| Summary |
"Evidence has shown that many capacitor failures can be attributed to field enhancement that occurs on the tips of electrodes within a multi-layer ceramic capacitor. This field enhancement is caused by an increased charge density at these points. In this research, a method to minimize the field enhancement is derived. Specifically, the resistivity in the dielectric region surrounding the tips is modified to allow charge on the conductor to distribute over a wide region. The optimal resistivity profile has been derived numerically through the combined use of finite element analysis and genetic algorithms. Designs resulting from the optimization are compared to a baseline multi-layer ceramic capacitor. It is shown that the field enhancement is nearly eliminated using relatively small changes in the resistivity of the dielectric."--Abstract, leaf iii. |
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