Theses/Dissertations
Author Koul, Amendra, 1984- author.

Title "In situ" printed circuit board material extraction procedure with conductor surface roughness study / by Amendra Koul.

Published [Rolla, Missouri] : Missouri University of Science and Technology, [2010]
LOCATION CALL # STATUS
 MST DEPOSITORY  THESIS T 9660/9692  MICROFILM    NOT CHECKED OUT
 MST Thesis  THESIS T 9675    NOT CHECKED OUT
Description x, 72 leaves : illustrations ; 29 cm
Summary "Analysis of printed circuit board (PCB) behavior in a wide frequency range from tens MHz to at least 40 GHz is very important for modern high-speed digital design and assuring for signal integrity (SI). this analysis includes preliminary evaluation of per-unit-length parameters of the PCB transmission line and transmission line characteristics, such as propagation and attenuation constants, and also extraction of these parameters from measurements on real test vehicles. This thesis describes an impedance calculator tool, which can substantially speed up PCB design, and the second topic considered in this work is characterization of dielectric parameters of substrates of printed circuit boards. The latter includes study of the effect of conductor surface roughness on the extracted material parameters of dielectrics. A new method to separate conductor loss from dielectric loss in rough PCB's is proposed"--Abstract, leaf iv.
Notes Vita.
Typescript.
This dissertation contains three papers for publication.
M.S. Missouri University of Science and Technology 2010.
Includes bibliographical references.
Subjects Printed circuits -- Testing.
Signal integrity (Electronics)
Dielectrics.
Other Titles Developing an SI toolset for engineering design discovery, physical insight, and education.
Improved technique for extracting parameters of low-loss dielectrics on printed circuit boards.
Differential method for separating dielectric and rough conductor losses in printed circuit boards.
MST Thesis. Electrical Engineering (M.S., 2010)
Additional Keywords Dielectrics.
Printed circuits Testing.
Signal integrity (Electronics)
OCLC/WorldCat Number 690920505